Active Learning of Abstract System Models from Traces using Model Checking
Natasha Yogananda Jeppu‚ Tom Melham and Daniel Kroening
Book Title
2022 Design‚ Automation & Test in Europe Conference & Exhibition‚ DATE 2022‚ Antwerp‚ Belgium‚ March 14−23‚ 2022
Editor
Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu
Month
March
Pages
100–103
Publisher
IEEE
Year
2022